Project: GRISU Abstract: Radiation damages to electronic components are an important issue for future FAIR experiments. One of the preferred technology for ASIC ...
The GSI Event Driven TDC GET4 The GSI Event Driven TDC with four channels GET4 is an application specific integrated circuit (ASIC) designed by the GSI ASIC desig...
Experiment Elektronik (EE) * Allgemeine Informationen aus der EE Abteilung * The department Experiment Electronics (EE), general information * Aktuell...