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Project: GRISU Abstract: Radiation damages to electronic components are an important issue for future FAIR experiments. One of the preferred technology for ASIC ...
2012-05-14 - 13:00
The GSI Event Driven TDC GET4 The GSI Event Driven TDC with four channels GET4 is an application specific integrated circuit (ASIC) designed by the GSI ASIC desig...
2019-06-19 - 10:21
Register map for front end cards Address Register Description Version 0xFFFFFC Version Main.ShizuMinami 24 Oct 2013
2013-10-29 - 12:55
http://www.gsi.de/informationen/wti/ee/elekt_entwicklung/sam5_e.html Main.JanHoffmann 22 Feb 2007
2007-02-22 - 17:09
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